Items where Author is "Beaufort, M.-F."
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Gandy, A. S., Donnelly, Steve E., Beaufort, M.-F., Vishnyakov, Vladimir and Barbot, J.-F. (2006) The effect of ion-beam specimen preparation techniques on vacancy-type defects in silicon. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 242 (1-2). pp. 610-613. ISSN 1872-9584