Comparing the resolution of magnetic force microscopes using the CAMST reference samples

Abelmann, L, Porthun, S, Haast, M, Lodder, C, Moser, A, Best, ME, Van Schendel, PJA, Stiefel, B, Hug, HJ, Heydon, GP, Farley, A, Hoon, SR ORCID: https://orcid.org/0000-0002-1250-9432, Pfaffelhuber, T, Proksch, R and Babcock, K (1998) Comparing the resolution of magnetic force microscopes using the CAMST reference samples. Journal of Magnetism and Magnetic Materials, 190 (1-2). pp. 135-147. ISSN 0304-8853

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Official URL: https://doi.org/10.1016/S0304-8853(98)00281-9

Abstract

A set of reference samples for comparing the results obtained with different magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with different thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very fine stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using different laser powers. These samples have been imaged in six different laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these different microscopes, tips and measurement methods varies between 30 and 100 nm. © 1998 Elsevier Science B.V. All rights reserved.

Item Type:	Article
Peer-reviewed:	Yes
Date Deposited:	14 Apr 2015 10:57
Publisher:	Elsevier
Additional Information:	This is an Accepted Manuscript of a work that was accepted for publication in Journal of Arid Environments. Changes resulting from the publishing process, such as editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication.
Divisions:
Subject terms:	Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Physics, Condensed Matter, Materials Science, Physics, magnetic force microscopy, resolution, Fourier analysis, low temperature, vacuum, magneto-optic, magnetic force microscopy, resolution, Fourier analysis, low temperature, vacuum, magneto-optic, 0204 Condensed Matter Physics, 0912 Materials Engineering, 0913 Mechanical Engineering, Applied Physics
URI:	https://e-space.mmu.ac.uk/id/eprint/550057
DOI:	https://doi.org/10.1016/S0304-8853(98)00281-9
ISSN	0304-8853

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