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Items where Author is "Stoyanov, Stoyan"

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Number of items: 7.

Article

Ahsan, Mominul, Stoyanov, Stoyan, Bailey, Chris and Albarbar, Alhussein ORCID logoORCID: https://orcid.org/0000-0003-1484-8224 (2020) Developing Computational Intelligence for Smart Qualification Testing of Electronic Products. IEEE Access, 8. pp. 16922-16933.

Stoyanov, Stoyan, Ahsan, Mominul, Bailey, Chris, Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515

Conference or Workshop Item

Ahsan, Mominul, Stoyanov, Stoyan and Bailey, Chris (2018) Data Driven Prognostics for Failure of Power Semiconductor Packages. In: 2018 41st International Spring Seminar on Electronics Technology (ISSE), 16 May 2018 - 20 May 2018, Zlatibor, Serbia.

Stoyanov, Stoyan, Ahsan, Md Mominul and Bailey, Chris (2018) Data Analytics Approach for Optimal Qualification Testing of Electronic Components. In: 2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 15 April 2018 - 18 April 2018, Toulouse, France.

Ahsan, Md, Stoyanov, Stoyan and Bailey, Chris (2017) Data-driven prognostics for smart qualification testing of electronic products. In: IEEE 40th International Spring Seminar on Electronics Technology (ISSE), 10 May 2017 - 14 May 2017, Sofia, Bulgaria.

Ahsan, Mominul, Stoyanov, Stoyan and Bailey, Chris (2016) Data driven prognostics for predicting remaining useful life of IGBT. In: 2016 39th International Spring Seminar on Electronics Technology (ISSE), 18 May 2016 - 22 May 2016, Pilsen, Czech Republic.

Ahsan, Mominul, Stoyanov, Stoyan and Bailey, Chris (2016) Prognostics of automotive electronics with data driven approach: A review. In: 2016 39th International Spring Seminar on Electronics Technology (ISSE), 18 May 2016 - 22 May 2016, Pilsen, Czech Republic.

This list was generated on Fri Aug 12 03:45:03 2022 BST.