Items where Author is "Pewton, Samuel William"
 | Up a level |
Group by: Item Type | No Grouping
Jump to: Conference or Workshop Item
Number of items: 1.
Conference or Workshop Item
Pewton, Samuel William and Yap, Moi Hoon 
ORCID: https://orcid.org/0000-0001-7681-4287
(2022)
Dark Corner on Skin Lesion Image Dataset: does it matter?
In: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), 19 June 2022 - 20 June 2022, New Orleans, USA.