Items where Author is "Bano, S"
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Eisenmann, M, Reinke, A, Weru, V, Tizabi, MD, Isensee, F, Adler, TJ, Ali, S, Andrearczyk, V, Aubreville, M, Baid, U, Bakas, S, Balu, N, Bano, S, Bernal, J, Bodenstedt, S, Casella, A, Cheplygina, V, Daum, M, De Bruijne, M, Depeursinge, A, Dorent, R, Egger, J, Ellis, DG, Engelhardt, S, Ganz, M, Ghatwary, N, Girard, G, Godau, P, Gupta, A, Hansen, L, Harada, K, Heinrich, M, Heller, N, Hering, A, Huaulmé, A, Jannin, P, Kavur, AE, Kodym, O, Kozubek, M, Li, J, Li, H, Ma, J, Martín-Isla, C, Menze, B, Noble, A, Oreiller, V, Padoy, N, Pati, S, Payette, K, Rädsch, T, Rafael-Patiño, J, Bawa, VS, Speidel, S, Sudre, CH, Van Wijnen, K, Wagner, M, Wei, D, Yamlahi, A, Yap, MH 
ORCID: https://orcid.org/0000-0001-7681-4287, Yuan, C, Zenk, M, Zia, A, Zimmerer, D, Aydogan, D, Bhattarai, B, Bloch, L, Brüngel, R, Cho, J, Choi, C, Dou, Q, Ezhov, I, Friedrich, CM, Fuller, C, Gaire, RR, Galdran, A, García Faura, A, Grammatikopoulou, M, Hong, S, Jahanifar, M, Jang, I, Kadkhodamohammadi, A, Kang, I, Kofler, F, Kondo, S, Kuijf, H, Li, M, Luu, M, Martinčič, T, Morais, P, Naser, MA, Oliveira, B, Owen, D, Pang, S, Park, J, Park, S, Płotka, S, Puybareau, E, Rajpoot, N, Ryu, K and Saeed, N
(2023)
Why is the winner the best?
In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 17 June 2023 - 24 June 2023, Vancouver, Canada.
ORCID: https://orcid.org/0000-0001-7681-4287, Yuan, C, Zenk, M, Zia, A, Zimmerer, D, Aydogan, D, Bhattarai, B, Bloch, L, Brüngel, R, Cho, J, Choi, C, Dou, Q, Ezhov, I, Friedrich, CM, Fuller, C, Gaire, RR, Galdran, A, García Faura, A, Grammatikopoulou, M, Hong, S, Jahanifar, M, Jang, I, Kadkhodamohammadi, A, Kang, I, Kofler, F, Kondo, S, Kuijf, H, Li, M, Luu, M, Martinčič, T, Morais, P, Naser, MA, Oliveira, B, Owen, D, Pang, S, Park, J, Park, S, Płotka, S, Puybareau, E, Rajpoot, N, Ryu, K and Saeed, N