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Magnetic force microscopy of soft magnetic materials

Valera, M. S. and Tomlinson, S.L. and Heydon, G.P. and Farley, A. N. and Hoon, Steve R. and Zhou, L. and McVitie, S. and Chapman, J. N. (1996) Magnetic force microscopy of soft magnetic materials. ISSN 0304-8853

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Abstract

The magnetic force microscopy of soft magnetic materials is a challenge due to the perturbing effect of the tip stray field on the samples magnetisation. Ferromagnetic thin film tips have been characterised by Lorentz electron microscopy and the tips employed in the study of a permalloy magneto-resistive sensor. Residual domains in the permalloy were detected and the location of domain walls related to the presence of imperfections in the edge of the sensor.

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