Magnetic force microscopy of soft magnetic materials

Valera, M. S., Tomlinson, S.L., Heydon, G.P., Farley, A. N., Hoon, S. R., Zhou, L., McVitie, S. and Chapman, J. N. (1996) Magnetic force microscopy of soft magnetic materials. Journal of Magnetism and Magnetic Materials, 157-8. pp. 555-556. ISSN 0304-8853

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Official URL: https://doi.org/10.1016/0304-8853(95)01064-5

Abstract

The magnetic force microscopy of soft magnetic materials is a challenge due to the perturbing effect of the tip stray field on the samples magnetisation. Ferromagnetic thin film tips have been characterised by Lorentz electron microscopy and the tips employed in the study of a permalloy magneto-resistive sensor. Residual domains in the permalloy were detected and the location of domain walls related to the presence of imperfections in the edge of the sensor.

Item Type:	Article
Peer-reviewed:	Yes
Date Deposited:	14 Apr 2015 11:05
Publisher:	Elsevier
Additional Information:	Full-text of this article is not available in this e-prints service. This article was originally published in Journal of magnetism and magnetic materials, published by and copyright Elsevier.
Divisions:
URI:	https://e-space.mmu.ac.uk/id/eprint/550084
DOI:	https://doi.org/10.1016/0304-8853(95)01064-5
ISSN	0304-8853

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