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    Potentiometric and magnetic force microscopy in multilayers

    Slade, M. A., Valera, M. S., Lambrick, D. B., Hoon, S. R., Farley, A. N., Holloway, H. and Kubinski, D. J. (1999) Potentiometric and magnetic force microscopy in multilayers. Journal of Magnetism and Magnetic Materials, 198-9. pp. 95-97. ISSN 0304-8853

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    The simultaneous collection of magnetic, topographic and potentiometric data has been achieved using a modified magnetic force microscope (MFM). Use of a reference sample confirmed that there was no interference between magnetic and potentiometric channels. Images of domain walls and of the surface potential in a Co/Cu multilayer system have been obtained. Domain walls observed are consistent with those obtained using conventional MFM whilst potentiometry revealed a constant background with small areas of higher or lower potential.

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