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Potentiometric and magnetic force microscopy in multilayers

Slade, M.A and Valera, M. S. and Lambrick, David B. and Hoon, Steve R. and Farley, Andrew and Holloway, H. and Kubinski, D.J (1999) Potentiometric and magnetic force microscopy in multilayers. ISSN 0304-8853

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Abstract

The simultaneous collection of magnetic, topographic and potentiometric data has been achieved using a modified magnetic force microscope (MFM). Use of a reference sample confirmed that there was no interference between magnetic and potentiometric channels. Images of domain walls and of the surface potential in a Co/Cu multilayer system have been obtained. Domain walls observed are consistent with those obtained using conventional MFM whilst potentiometry revealed a constant background with small areas of higher or lower potential.

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