Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method

Bardosova, M., Pemble, Martyn, Povey, I. M., Tredgold, R. H. and Whitehead, Debra (2006) Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method. Applied Physics Letters, 89 (9). 093116. ISSN 0003-6951

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Official URL: https://doi.org/10.1063/1.2339031

Abstract

The Langmuir-Blodgett method was used to engineer photonic crystal thin films of an AB architecture. Structures were studied by transmittance and reflectance spectroscopies. For an AB structure in which the silica particle diameter B is twice that of A, reflectance features associated with the first order Bragg peak for the “A” domain are only observed when the structure is probed from the A side of the structure. Furthermore, this feature is enhanced in intensity compared to that for a structure consisting solely of A particles. These findings are attributed to a matching of first and second order Bragg processes.

Item Type:	Article
Peer-reviewed:	Yes
Date Deposited:	07 Sep 2010 10:50
Publisher:	American Institute of Physics
Additional Information:	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in M. Bardosova, M. E. Pemble, I. M. Povey, R. H. Tredgold, and D. E. Whitehead , "Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method", Appl. Phys. Lett. 89, 093116 (2006) and may be found at https://aip.scitation.org/doi/10.1063/1.2339031.
Divisions:	Faculties > Science and Engineering
URI:	https://e-space.mmu.ac.uk/id/eprint/110760
DOI:	https://doi.org/10.1063/1.2339031
ISSN	0003-6951

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