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Yaylali, Banu, Gulten, Gokhan, Yesilyurt, Mustafa, Totik, Yasar, Kulczyk-Malecka, Justyna 
ORCID: https://orcid.org/0000-0002-4905-3635, Kelly, Peter ORCID: https://orcid.org/0000-0003-1008-4941 and Efeoglu, Ihsan
(2025)
Analysis of four-point bending test for Nb, Ta, and V-doped CrYN thin films deposited by closed-field unbalanced magnetron sputtering.
Surface and Coatings Technology, 518.
ISSN 0257-8972