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Atomic force microscopy as an in-situ technique for industry

Boyd, Robert D. and Verran, Joanna (2001) Atomic force microscopy as an in-situ technique for industry. Microscopy and analysis, 15 (4). pp. 5-6. ISSN 0958-1952

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Abstract

The invention of the atomic force microscope allowed, for the first time, high resolution imaging of non-conducting surfaces without the need for any additional sample preparation. Until recently, AFM has been limited to looking at samples within the laboratory. However the incorporation of the AFM into small, rigid and portable devices allows in-situ analysis. We have used this method to obtain in-situ AFM images of surfaces within commercial environments, showing the effects of wear and the presence of contaminating material on the surface. In the future, in-situ AFM may become increasingly important for the food, manufacturing, environmental and quality assurance industries.

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